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參考文獻與實證個案

1. Chen, Y.-J., Fan, C.-Y., and Chang, K.-H. (2016), “Manufacturing Intelligence for Reducing False Alarm of Defect Classification by Integrating Similarity Matching Approach in CMOS Image Sensor Manufacturing,” Computers & Industrial Engineering, DOI: 10.1016/j.cie.2016.05.009.

2. Chien, C.-F., Liu, C.-W., and Chuang, S.-C. (2015), “Analysing Semiconductor Manufacturing Big Data for Root Cause Detection of Excursion for Yield Enhancement,” International Journal of Production Research, DOI:10.1080/00207543.2015.1109153.

3. Hsu, C.-Y., Lin, S.-C., and Chien, C.-F. (2015), “A back-propagation neural network with a distributed lag model for semiconductor vendor-managed inventory,” Journal of Industrial and Production Engineering, 32(3), 149-161.

4. Chien, C.-F., Chen, Y.-J., and Hsu, C.-Y. (2015), “A Novel Approach to Hedge and Compensate the Critical Dimension Variation of the Developed-and-Etched Circuit Patterns for Yield Enhancement in Semiconductor Manufacturing,” Computers & Operations Research, 53, 309-318.

5. Chien, C.-F. and Chuang, S.-C. (2014), “A Framework for Root Cause Detection of Sub-Batch Processing System for Semiconductor Manufacturing Big Data Analytics,” IEEE Transactions on Semiconductor Manufacturing, 27(4), 475-488.

6. Chien, C.-F., Chang, K.-H., and Wang, W.-C. (2014), “An Empirical Study of Design-of-Experiment Data Mining for Yield-Loss Diagnosis for Semiconductor Manufacturing,” Journal of Intelligent Manufacturing, 25(5), 961-972.

7. Yu, H.-C., Lin, K.-Y., and Chien, C.-F. (2014), “Hierarchical Indices to Detect Equipment Condition Changes with High Dimensional Data for Semiconductor Manufacturing,” Journal of Intelligent Manufacturing, 25(5), 933-943.

8. Chien, C.-F. and Hsu, C.-Y. (2014), “Data Mining for Optimizing IC Feature Designs to Enhance Overall Wafer Effectiveness,” IEEE Transactions on Semiconductor Manufacturing, 27(1), 71-82.

9. Chien, C.-F., Diaz, A.C., and Lan, Y.-B. (2014), “A Data Mining Approach for Analyzing Semiconductor MES and FDC Data to Enhance Overall Usage Effectiveness (OUE),” International Journal of Computational Intelligence Systems, 7 (Supplement 2), 52-65.

10. Chien, C.-F., Chen, Y.-J., Hsu, C.-Y., and Wang, H.-K. (2014), “Overlay Error Compensation Using Advanced Process Control with Dynamically Adjusted Proportional-Integral R2R Controller,” IEEE Transactions on Automation Science and Engineering, 11(2), 473-484.

11. Chen, Y.-J., Lin, T.-H., Chang, K.-H., and Chien, C.-F. (2013), “Feature Extraction for Defect Classification and Yield Enhancement in Color Filter and Micro-Lens Manufacturing and an Empirical Study,” Journal of Industrial and Production Engineering, 30(8), 510-517.

12. Chien, C.-F., Hsu, C.-Y., and Chen, P.-L. (2013), “Semiconductor Fault Detection and Classification for Yield Enhancement and Manufacturing Intelligence,” Flexible Services and Manufacturing Journal, 25(3), 367-388.

13. Liu, C.-W. and Chien, C.-F. (2013), “An Intelligent System for Wafer Bin Map Defect Diagnosis: An Empirical Study for Semiconductor Manufacturing,” Engineering Applications of Artificial Intelligence, 26(5-6), 1479-1486.

14. Chien, C.-F., Hsu, S.-C., and Chen, Y.-J. (2013), “A System for Online Detection and Classification of Wafer Bin Map Defect Patterns for Manufacturing Intelligence,” International Journal of Production Research, 51(8), 2324-2338.

15. Chien, C.-F., Hsu C.-Y., and Hsiao, C. (2012), “Manufacturing Intelligence to Forecast and Reduce Semiconductor Cycle Time,” Journal of Intelligent Manufacturing, 23(6), 2281-2294.

16. Chien, C.-F. and Hsu, C.-Y. (2011), “UNISON Analysis to Model and Reduce Step-and-Scan Overlay Errors for Semiconductor Manufacturing,” Journal of Intelligent Manufacturing, 22(3), 399-412.

17. Chen, L.-F. and Chien, C.-F. (2011), “Manufacturing Intelligence for Class Prediction and Rule Generation to Support Human Capital Decisions for High-Tech Industries,” Flexible Services and Manufacturing Journal, 23(3), 263-289.

18. Kuo, C.-J., Chien, C.-F., and Chen, C.-D. (2011), “Manufacturing Intelligence to Exploit the Value of Production and Tool Data to Reduce Cycle Time,” IEEE Transactions on Automation Science and Engineering, 8(1), 103-111.

19. Chien, C.-F. and Chen, L. (2007), “Using Rough Set Theory to Recruit and Retain High-Potential Talents for Semiconductor Manufacturing,” IEEE Transactions on Semiconductor Manufacturing, 20(4), 528-541.

20. Chien, C.-F., Wang, W., and Cheng, J. (2007), “Data Mining for Yield Enhancement in Semiconductor Manufacturing and an Empirical Study,” Expert Systems with Applications, 33(1), 192-198. (NSC93-2213-E-007-008)

21. Hsu, S. and Chien, C.-F. (2007), “Hybrid Data Mining Approach for Pattern Extraction from Wafer Bin Map to Improve Yield in Semiconductor Manufacturing,” International Journal of Production Economics, 107(1), 88-103.

22. Chien, C.-F. and Hsu, C.-Y. (2006), “A Novel Method for Determining Machine Subgroups and Backups with an Empirical Study for Semiconductor Manufacturing,” Journal of Intelligent Manufacturing, 17(4), 429-439.

23. Chen, Y.-J., Fan, C.-Y., and Chang, K.-H. (2016), “Manufacturing Intelligence for Reducing False Alarm of Defect Classification by Integrating Similarity Matching Approach in CMOS Image Sensor Manufacturing,” Computers & Industrial Engineering, DOI: 10.1016/j.cie.2016.05.009

24. Chien, C.-F., Liu, C.-W., and Chuang, S.-C. (2015), “Analysing Semiconductor Manufacturing Big Data for Root Cause Detection of Excursion for Yield Enhancement,” International Journal of Production Research, DOI:10.1080/00207543.2015.1109153